Effect of Chemical Bonding and Relative Density on Microwave Dielectric Properties of LiInW2O8 Ceramics

Xi Wang,Zelai Cheng,Yulan Jing,Xiaoli Tang,Hua Su
DOI: https://doi.org/10.1016/j.jallcom.2024.177090
IF: 6.2
2025-01-01
Journal of Alloys and Compounds
Abstract:To meet the demands of the growing field of electronic communications, LiInW2O8 ceramics with low dielectric loss (high Qxf) and low dielectric constant (Er) are prepared by a solid phase reaction method. X-ray diffractometry reveals a scheelite single-phase structure for the prepared ceramics. Compared with the standard LiInW2O8, the as-prepared LiInW2O8 has a higher relative diffraction intensity for the (200) crystal plane, indicating an anisotropic growth phenomenon in the present case. Raman spectroscopy and calculations of the PV-L complex chemical bonding theory show that W-O bonding is a key factor affecting the dielectric properties of LiInW2O8 ceramics. Furthermore, excellent microwave dielectric properties with Er approximate to 14.2, Qxf approximate to 63000 GHz, and of approximate to -28 ppm/degree celsius are obtained by sintering the ceramic at 1025 degrees C.
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