Electrothermal Properties Characterization of Transition Edge Sensor Bolometers Based on R-T Tests

Qing Yu,Yongping Li,Kaiyong He,Yu Xu,Mingjun Cheng,Zhengwei Li,Jianshe Liu,Wei Chen,Guodong Chen
DOI: https://doi.org/10.21203/rs.3.rs-5356549/v1
2024-01-01
Abstract:Understanding the weak thermal links in support legs of transition edge sensors (TES) is essential for developing highly sensitive TES bolometers for cosmic microwave background (CMB) detection. The thermal and electrical properties of the TES are usually characterized by I-V tests with superconducting quantum interference devices (SQUIDs) in laboratories before being deployed into a telescope system. In this work, a method for testing the electrothermal properties based on R-T tests is proposed to obtain the critical temperature Tc, saturation power Psat and thermal conductance G of a TES. This method relies on that the weak thermal links of a biased TES in a non superfluid state cause the TES temperature (TTES) to be higher than the base temperature (Tb). So the Tb value at the transition edge in Tb drop test relies on the set current. The relationship between the thermal power PTES and the Tb value at the transition edge can be obtained, and parameters can be fitted by thermal conduction equation. Numerical calculations of the superconducting phase transition of the device in R-T tests were conducted, and then experimental results were obtained that reflect the expected results. The I-V testing was also conducted on the same sample, and the comparison results reflected the practicability of this method. This approach provides a simpler and more cost-effective alternative to I-V method for obtaining the electrothermal properties of TES, enriching the characterization methods.
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