Two-dimensional Bi2SeO2 and Its Native Insulators for Next-Generation Nanoelectronics

Pedram Khakbaz,Dominic Waldhoer,Mina Bahrami,Theresia Knobloch,Mohammad Rasool Davoudi,Mahdi Pourfath,Yichi Zhang,Xiaoyin Gao,Hailin Peng,Michael Waltl,Tibor Grasser
DOI: https://doi.org/10.26434/chemrxiv-2024-72gpv
2024-11-08
Abstract:Silicon’s dominance in integrated circuits is largely due to its stable native oxide, SiO2, known for its insulating properties and excellent interface to the Si channel. However, silicon-based FETs face significant challenges when further scaled, inspiring the search for better semiconductors. While 2D materials such as MoS2, WSe2, BP, and InSe are promising, they lack a stable and compatible native oxide. High mobility (812 cm2V−1S−1) 2D Bi2SeO2 stands out in this regard, as it can be oxidized into different forms of Bi2SeO5, thereby forming compatible high-κ native oxides. Despite growing interest in this material system, a comprehensive understanding of its fundamental properties is lacking. This study uses Density Functional Theory and Molecular Dynamics simulations to investigate the intrinsic properties of Bi2SeO2 and its native oxides. Additionally, Scanning Transmission Electron Microscopy is employed to complement these theoretical analyses, providing detailed insights into the atomic scale structure and interfaces of these materials. Building on these findings, we model semiconductor-oxide heterostructures and extract their intrinsic properties. Our results demonstrate that the atomically sharp and clean interface between oxide and semiconductor, the high dielectric constant (>30) of the oxide, and the sufficiently large band offsets between the semiconductor and the most relevant beta-phase of its native insulator (1.13 eV for holes and 1.55 eV for electrons) make this material system a strong candidate for future transistor technologies. These properties mitigate the limitations of traditional semiconductors and enhance device performance at the ultimate scaling limit, positioning 2D Bi2SeO2 as a suitable choice for next-generation nanoelectronics.
Chemistry
What problem does this paper attempt to address?
The main problem that this paper attempts to solve is to explore the application potential of the two - dimensional material Bi₂SeO₂ and its native insulator in next - generation nano - electronic devices. Specifically, the research focuses on the following aspects: 1. **Understanding of basic material properties**: Although Bi₂SeO₂ has attracted attention due to its high mobility (812 cm²V⁻¹s⁻¹ at room temperature), its basic properties, such as the precise crystal structure and intrinsic material characteristics, are still lack of comprehensive understanding. 2. **Formation and properties of native oxides**: Through density functional theory (DFT) and molecular dynamics (MD) simulations, as well as scanning transmission electron microscopy (STEM) experiments, the research explored the process of Bi₂SeO₂ being oxidized into different forms of Bi₂SeO₅ and its properties, especially its potential as a high - κ native oxide. 3. **Performance of semiconductor - oxide heterojunctions**: The paper also studied two different semiconductor - oxide heterojunctions. By applying strain, it explored the possible range of actual interface parameters and evaluated the intrinsic properties of these heterojunctions, especially the interface quality and band - gap alignment. 4. **Improvement of device performance**: The research aims to show how Bi₂SeO₂ and its native oxide, with atomically sharp and clean interfaces, high dielectric constant (> 30), and sufficient band - gap offset between the semiconductor and the native insulator (1.13 eV for holes and 1.55 eV for electrons), can make this material system a strong candidate for future transistor technology, thereby alleviating the limitations of traditional semiconductors and improving the performance of devices under extreme scaling. Through these studies, the paper hopes to provide theoretical basis and technical support for the design and manufacturing of next - generation nano - electronic devices.