Focused Ion Beam Methods and Its Applications in Secondary Batteries

Ni Yang,Yali Li,Lian Wang,Tinglu Song,Yuefeng Su
DOI: https://doi.org/10.2174/9789815305425124010005
2024-01-01
Abstract:This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.
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