Decipher the Wavelength and Intensity Using Photothermoelectric Detectors.

Jiamin Zhou,Shengduo Xu,Yi Shuai,Qiang Sun,Huangshui Ma,Chao Wang,Haijuan Wu,Shanshan Tan,Zegao Wang,Lei Yang

DOI: https://doi.org/10.1021/acsami.4c10489

IF: 9.5

2024-01-01

ACS Applied Materials & Interfaces

Abstract:Broadband photodetectors that can decipher the wavelength (lambda) and intensity (I) of an unknown incident light are urgently demanded. Photothermoelectric (PTE) detectors can achieve ultrabroadband photodetection surpassing the bandgap limitation; however, their practical application is severely hampered by the lack of deciphering strategy. In this work, we report a variable elimination method to decipher lambda and I of the incident lights based on an integrated Ag2Se film-based PTE detector. Nanostructured Ag2Se films with controlled thickness are synthesized using an ion sputtering of Ag and a room-temperature selenization method and then assembled into a detector. Under identical illumination, Ag2Se films of different thicknesses produce varying output photothermal voltages, influenced by factors including lambda. By establishing a direct relationship between the photothermal voltage and the absorption of Ag2Se films of varied thickness, we successfully eliminate variables independent of lambda, thus determining lambda. Subsequently, I is determined by the calibrated responsivity relationship using obtained lambda. Our PTE detector achieves a broadband spectrum from 400 to 950 nm and high accuracy, with deviations as low as similar to 2.63 and similar to 0.53% for deciphered lambda and I, respectively. This method allows for self-powered broadband decipherable photodetection without a complex device architecture or computational assistance, which could boost the research enthusiasm and promote the commercialization of PTE broadband detectors.