The Role of Line-Shaped Defects in Premature Breakdown of $\Beta-\Text{ga}_{2}\mathrm{o}_{3}$ Power Diode and Suppression by Oxygen Annealing

Jinyang Liu,Qiuyan Li,Zhao Han,Guangwei Xu,Shu Yang,Zheyang Zheng,Shibing Long
DOI: https://doi.org/10.1109/ispsd59661.2024.10579644
2024-01-01
Abstract:In this work, we illuminate the impact of line-shaped defects (LDs) on the premature breakdown phenomena observed in beta-G(a)2O(3) Schottky barrier diodes (SBDs). Adopting the Conductive Atomic Force Microscopy (C-AFM) and Kelvin Probe Force Microscopy (KPFM) technique, it has been determined that LDs manifest local electrical properties characterized by larger reverse current and lower surface potential. Additionally, the high-temperature oxygen annealing has been proved to be an effective method in decreasing this killer defect density, in favor of the fabrication of SBDs with a breakdown voltage in excess of 2100 V. This study establishes a relationship between the blocking ability of beta-Ga2O3 SBDs and killer defects, offering valuable insights into the mechanism underlying the reverse characteristics of SBDs, as well as guidance for high-quality crystal growth and device design.
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