Realizing Topological Edge States in a Silicon Nitride Microring-Based Photonic Integrated Circuit.

Chenxuan Yin,Yujie Chen,Xiaohui Jiang,Yanfeng Zhang,Zengkai Shao,Pengfei Xu,Si‐Yuan Yu
DOI: https://doi.org/10.1364/ol.41.004791
2016-01-01
Abstract:Topological edge states in a photonic integrated circuit based on the platform of silicon nitride are demonstrated with a two-dimensional coupled resonator optical waveguide array involving the synthetic magnetic field for photons at near-infrared wavelengths. Measurements indicate that the topological edge states can be observed at certain wavelengths, with light travelling around the boundary of the array. Combined with the induced disorders in fabrication near the edge, the system shows the defect immunity under the topological protection of edge states.
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