Development of Electron Temperature Measuring System by Silicon Drift Detector

Xianfang Song,Xianying,Jinfu Yang,Jinwei,Liao,Min MIN,Qing Li,Yan Xu,Bo Zhang,Yipo,FUBingzhong,Bin Luo,Cuiwen
2005-01-01
Abstract:Soft X-ray spectroscopy with two channels Silicon Drift Detector(SDD) are adopted for electron temperature measuring on HL-2A tokamak in 2005. The working principle,design and first operation of the SDD soft X-ray spec- troscopy are introduced.The measuring results of electron temperature are also presented.The results show that the SDD is very good detector for electron temperature measuring on HL-2A tokamak.These will become a solid basic work to establish SDD array for electron temperature profiling.
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