IODP Expedition 376 Color Reflectance

Cornel E.J. de Ronde,Susan E. Humphris,Tobias W. Höfig,Phillipp A. Brandl,Lanlan Cai,Yuanfeng Cai,Fabio Caratori Tontini,Jeremy R. Deans,Aida Farough,John W. Jamieson,Kannikha P. Kolandaivelu,Anna Kutovaya,Jessica Labonté,Andrew J. Martin,Cécile Massiot,Jill M. McDermott,Iona M. McIntosh,Tatsuo Nozaki,Vivian H. Pellizari,Agnes G. Reyes,Stephen Roberts,Olivier Rouxel,Lucy E.M. Schlicht,Jung H. Seo,Susanne M. Straub,Karen Strehlow,Ken Takai,Dominique Tanner,Frank J. III Tepley,Chao Zhang
DOI: https://doi.org/10.5281/zenodo.7504138
2019-01-01
Abstract:Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units.
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