IODP Expedition 363 Scanning Electron Microscope Images

Yair Rosenthal,Ann Holbourn,Denise K. Kulhanek,Ivano W. Aiello,Tali L. Babila,Germain Bayon,Luc Beaufort,Samantha C. Bova,Jong Hwa Chun,Haowen Dang,Anna Joy Drury,Tom Dunkley Jones,Patrícia P.B. Eichler,Kelly A. Gibson,Robert G. Hatfield,Daniel L. Johnson,Yuho Kumagai,Tiegang Li,Braddock K. Linsley,Niklas Meinicke,Gregory S. Mountain,Bradley N. Opdyke,Paul N. Pearson,Christopher R. Poole,Ana Christina Ravelo,Takuya Sagawa,Allan G. Salazar Fernando,Anne‐Désirée Schmitt,Jennifer B. Wurtzel,Jian Xu,Masanobu Yamamoto,Yige Zhang
DOI: https://doi.org/10.5281/zenodo.10520352
2018-01-01
Abstract:Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken.
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