IODP Expedition 363 Color Reflectance

Yair Rosenthal,Ann Holbourn,Denise K. Kulhanek,Ivano W. Aiello,Tali L. Babila,Germain Bayon,Luc Beaufort,Samantha C. Bova,Jong Hwa Chun,Haowen Dang,Anna Joy Drury,Tom Dunkley Jones,Patrícia P.B. Eichler,Kelly A. Gibson,Robert G. Hatfield,Daniel L. Johnson,Yuho Kumagai,Tiegang Li,Braddock K. Linsley,Niklas Meinicke,Gregory S. Mountain,Bradley N. Opdyke,Paul N. Pearson,Christopher R. Poole,Ana Christina Ravelo,Takuya Sagawa,Allan G. Salazar Fernando,Anaïs Schmitt,Jennifer B. Wurtzel,Jian Xu,Masanobu Yamamoto,Yige Zhang
DOI: https://doi.org/10.5281/zenodo.10520344
2018-01-01
Abstract:Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units.
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