A Fully Integrated 10-Bit 100 MS/s SAR ADC with Metastability Elimination for the High Energy Physics Experiments
Shuxin Cao,Chenxu Wang,Liang Zhang,Min Luo,Wei Yan,Yuehong Gong
DOI: https://doi.org/10.1016/j.nima.2020.164415
IF: 1.335
2020-01-01
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
Abstract:This paper presents a fully integrated 10-bit 100 MS/s successive approximation register (SAR) ADC for the high energy physics experiments. The ADC uses a non-binary weighted capacitor digital-to-analog converter (C-DAC) network and a hybrid capacitor switching procedure to increase conversion accuracy and speed. A metastability elimination technique is employed to avoid comparator metastability, and then reduce the conversion error rate (CER) at high-speed asynchronous operations. The full custom static logic is used to improve the radiation hardness. The ADC was designed and fabricated in a 40 nm CMOS process. It occupies 0.078 mm(2) active area, including a reference generator, with a core area of 0.037 mm(2). The measured ADC core power consumption and the total power consumption are 1.32 mW and 8.5 mW respectively, including the reference generator at a 1.1 V supply. The resulting figure-of-merit (FOM), for sampling rate 100 MS/s, is 130 fJ/conversion-step. It achieves a good dynamic performance with similar to 9.3-bit effective number of bits (ENOB) at 100 MS/s with 14.97 MHz input signal. The measured spurious free dynamic range (SFDR), total harmonic distortion (THD) and signal-to-noise ratio (SNR) are 72.6 dB, -69.2 dB, 58.3 dB, respectively. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.62/-0.4 LSB and +0.67/-0.54 LSB respectively.