Quantitative Accuracy Assessment of Trace Elements and Halogens in Apatite by Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Meng-Qin Wang,Ke-Da Cai,Zhan-Ping Li,Chong Guo
DOI: https://doi.org/10.1039/d4ja00034j
2024-01-01
Journal of Analytical Atomic Spectrometry
Abstract:The first quantitative accuracy assessment of trace elements and halogens in apatite measured by TOF-SIMS.
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