Automatic Differentiation-Assisted Fourier Ptychographic Microscopy

Yang Wu,Chao Tan,Jun Wang,Ni Chen
DOI: https://doi.org/10.1364/cosi.2024.cw3b.6
2024-01-01
Abstract:Fourier ptychographic microscopy (FPM) enables wide-field-of-view and high-resolution imaging. However, the precise offset should align LED array before recovering,otherwise it causes artifacts. To tackle it, we present a differentiable FPM technique to handle misalignments.
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