Abstract:In this paper, we propose a method based on deep neural networks for the statistical design of flip-flops, taking into account nonlinear performance constraints. Flip-flop design and manufacturing are influenced by random variations in the technological process, making deterministic design approaches inadequate for achieving high yields. The conventional yield maximization method using Monte Carlo (MC) simulation is a time-consuming process. Also, for many performance constraints, either there are no analytical formulations or if they exist, they are not sufficiently accurate to be used in circuit optimization. To address these challenges, we approximated the nonlinear constraints with linearized ones (polyhedral approximation) and performed a yield maximization process which was done by developing our first proposed method. Then in the second proposed method, we used deep neural networks to generate precise nonlinear closed-form models for circuit performance metrics and also replaced MC simulation with an analytical yield formula. The combination of these techniques significantly enhances the speed and accuracy of statistical circuit design by employing powerful gradient-based optimization methods that converge quickly to the optimal solution. Experimental results demonstrate that our proposed approach enables the design of circuits with various performance constraints under process variation, and achieves more optimum results with much fewer iterations and less CPU time compared to the conventional simulation-based yield maximization methods.

Efficient Memory Circuits Yield Analysis and Optimization Framework Via Meta-Learning

Design Time Body Bias Selection for Parametric Yield Improvement.

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Efficient Bayesian Yield Analysis and Optimization with Active Learning

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An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Optimizing for In-memory Deep Learning with Emerging Memory Technology

An Efficient SRAM Yield Analysis Method using Multi -Fidelity Neural Network

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

Efficient and Accurate Statistical Analog Yield Optimization and Variation-Aware Circuit Sizing Based on Computational Intelligence Techniques

Analog Circuit Yield Optimization Via Freeze–Thaw Bayesian Optimization Technique

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

Yield Driven Design and Optimization for Near Threshold Voltage Sram Cells

Predicting Memory Compiler Performance Outputs using Feed-Forward Neural Networks

Optimization Schemes for In-Memory Linear Regression Circuit With Memristor Arrays

OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits

Efficient SRAM yield optimization with mixture surrogate modeling

Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints

An Efficient Bi-Objective Optimization Framework for Statistical Chip-Level Yield Analysis under Parameter Variations.

Yield Optimization for Analog Circuits over Multiple Corners Via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation