Spectroellipsometric Studies on Electrochemistry and its Application

Zongqing Huang,Shengtao Zhang,S. Xie,Changguo Chen,Yongrong Yang,Wancheng Zhu
DOI: https://doi.org/10.61558/2993-074x.3183
1999-01-01
Abstract:Ellipsometric measurements are often extremely sensitive to the presence of very thin surface layers,to changes in their thickness(or coverage),and to changes in surface topography at an atomic scale.These characteristics make the use of ellipsometry for electrochemical studies particularly attractive.The ellipsometric studies on electrochemistry and its applications carried out in the Electrochemical Laboratory of Chongqing University are reviewed briefly: 1)The studies on electrochemistry of classical ellipsometry: 2)The new function V op suggested by the authors. 3)The applications of new approcaches with new function V op suggested by the authors.
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