Abstract:Combining time‐resolved optical spectroscopy and surface acoustic waves provide a powerful tool for investigating charge carrier dynamics in 2D materials. When interacting with the 2D semiconductor WSe2, dynamic acoustic Poole–Frenkel activation of traps enhances the optical emission efficiency. The sub‐nanosecond modulation of the optical signal serves as a sensitive local probe of defects and charge carrier trapping sites. The charge carrier dynamics are investigated by surface acoustic waves (SAWs) inside a WSe2 monolayer on LiNbO3 by scanning acousto‐optoelectric spectroscopy. A strong enhancement of the PL emission intensity is observed almost over the entire area of the flake. This enhancement increases with increasing amplitude of the wave and is especially strong at or in the vicinity to defects. The latter is attributed to the SAW‐driven Poole–Frenkel activation of trapped charge carriers bound to trapping sites at these defects. In addition, the PL intensity exhibit clear periodic modulations at the SAW's frequency fSAW and at 2 fSAW. These modulations are clear and unambiguous fingerprints of spatio‐temporal carrier dynamics driven by the SAW. These occur on sub‐nanosecond timescales which are found in good agreement with calculated exciton dissociation times. Mapping and analyzing both effects, this study shows that scanning acousto‐electric spectroscopy provides a highly sensitive and local contact‐free probe which uncovers distinct local features not resolved by conventional quasi‐static photoluminescence techniques. The method is ideally suited to study carrier transport in 2D and other types of nanoscale materials and to reveal dynamic exciton modulation, and carrier localization and activation dynamics in the technologically important megahertz to gigahertz frequency range.

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