Preparation and High-Frequency Dielectric Properties of Cu/SiO<sub>2</sub> Composites

Kai Sun,Runhua Fan,Zi Dong Zhang,Xihua Zhang,Ke Yan,Min Chen
DOI: https://doi.org/10.4028/www.scientific.net/kem.655.174
2015-01-01
Key Engineering Materials
Abstract:In this paper, Cu/SiO 2 composites with different metal contents were successfully prepared by a selective reduction process. The phase composition and microstructure of composites were analyzed by XRD and SEM, respectively. The results show that spherical copper particles are uniformly distributed in silica matrix. The impedance and permittivity of composites were tested with RF impedance analyzer (0.1~1 GHz). It is indicated Cu/SiO 2 composites exhibit capacitive character. In addition, the dielectric constants get enlarged due to the enhancement of interface polarization.
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