BIST for NoC Crosstalk Based on Packet Network Structure

Yue Hao
IF: 1.992
2007-01-01
Microelectronics Journal
Abstract:A built-in self-test(BIST) methodology for testing inter-switch links of network on chip(NoC) is proposed,which can reduce both test time and test circuit area.For bus frequency below 1 GHz,capacitive coupling is the main factor for crosstalk in large scale NoC chips.With parallel test infrastructure,victim lines could be tested simultaneously,so that the test time and circuit area can be reduced efficiently.The performance of time and area consumption is analyzed,and results from simulation of 3×3 mesh NoC are included to support the proposed method and analyses.
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