Abstract:With the aggressive scaling of submicron technology, intermittent faults are becoming one of the limiting factors in achieving high reliability in Network-on-Chip (NoC). Increasing test frequency is necessary to detect intermittent faults, which in turn interrupts the execution of applications. On the other hand, the primary goal of traditional mapping algorithms is to allocate applications to the NoC platform, ignoring the test requirement. In this paper, we propose a novel testing-aware mapping algorithm (TAMA) for NoC, targeting intermittent faults on the paths between crossbars. In this approach, the idle paths are identified, and the components between two crossbars are tested when the application is mapped to the platform. The components can be tested if there is enough time from the time when the application leaves the platform to the time when a new application enters it. The mapping algorithm is tuned to give a higher priority to the tested paths in the next application mapping, which leaves enough time to test the links and the belonging components that have not been tested in the expected time. Experiment results show that the proposed testing-aware mapping algorithm leads to a significant improvement over FF(Fiexitrst Free), NN(Nearest Neighbor), CoNA(Contiguous Neighborhood Allocation), and WeNA(Weighted-based Neighborhood Allocation).

Efficient Design-for-Test Approach for Networks-on-Chip

Non-Blocking BIST for Continuous Reliability Monitoring of Networks-on-Chip

Research on BIST Test Method for Network-on-chip FIFOs

A Research of Network-on-Chip Routers Test

BIST for NoC Crosstalk Based on Packet Network Structure

Component Dependencies Based Network-on-Chip Test

A Unified Test and Fault-Tolerant Multicast Solution for Network-on-chip Designs

Accelerating Strategy for Functional Test of NoC Communication Fabric

Parallel Software-Based Self-Testing with Bounded Model Checking for Kilo-Core Networks-on-Chip

Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks

A New Unicast-Based Multicast Scheme for Network-on-Chip Router and Interconnect Testing

Testing Aware Dynamic Mapping for Path-Centric Network-on-chip Test

Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture

Fault-Tolerant Unicast-Based Multicast for Reliable Network-on-Chip Testing

Research of Interconnection Delay Fault Detection of Network-on-Chip

Optimizing the Efficiency of Accelerated Reliability Testing for the Internet Router Motherboard

Optimizing Dynamic Mapping Techniques for On-Line NoC Test

Test Access Mechanism Design and Test Controlling for Network-on-Chip.

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Built-in self-testable data path synthesis

A Cost-Effective Scheme for Network-on-Chip Router and Interconnect Testing