An Energy and Time Measurement ASIC for Large Pixel Semiconductor Detectors for Spectroscopic and Imaging Applications

T. Wei,Z. Deng,X. Wang
DOI: https://doi.org/10.1109/nss/mic44845.2022.10398926
2022-01-01
Abstract:The paper presents the development of an energy and time measurement readout ASIC (TEPIX) for large pixel semiconductor detectors. It integrates 128 channel signal processing circuits and is targeting for detectors with pixel size of 0.5 – 2 mm for spectroscopic and imaging applications such as SPECT and Compton camera. Each channel consists of a charge integration front-end, a discriminator, the sample and hold circuits and a Wilkinson type ADC. The time of arrival (TOA) is measured by recording the clock counter when the discriminator is fired. The ASIC uses a charge integration front-end but operates in single particle mode. The signal will be firstly integrated in a switched integrator, followed by a CDS amplifier and discriminator to identify different events. The chip works at frame-based mode. In total 4-channel sample and hold units are integrated in each channel, which means that at most 4 events can be detected and recorded in a single frame. The signal integration, sampling and hold and the ADC conversion are pipelined in the ASIC to minimize dead time. The zero compression is also adopted to reduce the data bandwidth. Simulation results show good performance at 10 kHz frame rate with noise of about 130 electrons(ENC@0.5 pF detector capacitance). The main functions of this chip have been verified via electronic test. A small mistake in layout design limits its noise performance, which will be improved in the next version.
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