Design of Test-bench System for the Multi-frequency Array Induction Imaging Logging Tool Based on Embedded Structures

Jian Lü
2011-01-01
Abstract:A design of test-bench system for MIT is introduced.According to the structural characteristics of the Array induction logging tool,the test-bench focuses on coil,the coils and the whole tool.The three level subtest systems are formed from IC components.Principal and subordinate structure are employed.The host PC and the front-computer based on embedded technique interconnect via Ethernet are presented.The front-computer extends a self-define bus,applying the physical structure of the PC104 module,to access all kinds of subtest function boards.That makes the front-computer and subtest function boards to form a self-stacking module and enhances reliability and scalability.The test system is successfully applied to the process of MIT's industrialization and a good test platform for new coil and coils design.
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