Acta Optica Sinica (selected Articles)

Min Yi,Chunfei Li,Qihong Wu
1986-01-01
Acta Optica Sinica
Abstract:: Contents: The Second National Conference On Basic Optics and the Technical Committee Meeting on Basic Optics Held at Jungbo Lake; and The Inhomogeneity of the Optical Thin Film Determined by Real Time Elliptic Polarization Measurement. Abstract: An automatic photometric ellipsometer with rotating-analyzer is used in our vacuum thin film coater. This ellipsometer can measure the polarization of the depositing thin film instantly. The inhomogeneity of the refractive index can be analyzed from the path curve of the polarization parameters. Delta and Psi which vary with the thickness of the thin film. The experimental results show that both Zinc Sulfide and Zinc Selenide have about 100 A of inhomogeneous transition layers at the inner and outer boundaries. In the central region, it has homogeneous refractive index.
What problem does this paper attempt to address?