Abstract:The multi-scale characterization of building materials is necessary to understand complex mechanical processes, with the goal of developing new more sustainable materials. To that end, imaging methods are often used in materials science to characterize the microscale. However, these methods compromise the volume of interest to achieve a higher resolution. Dark-field (DF) contrast imaging is being investigated to characterize building materials in length scales smaller than the resolution of the imaging system, allowing a direct comparison of features in the nano-scale range and overcoming the scale limitations of the established characterization methods. This work extends the implementation of a dual-phase X-ray grating interferometer (DP-XGI) for DF imaging in a lab-based setup. The interferometer was developed to operate at two different design energies of 22.0 keV and 40.8 keV and was designed to characterize nanoscale-size features in millimeter-sized material samples. The good performance of the interferometer in the low energy range (LER) is demonstrated by the DF retrieval of natural wood samples. In addition, a high energy range (HER) configuration is proposed, resulting in higher mean visibility and good sensitivity over a wider range of correlation lengths in the nanoscale range. Its potential for the characterization of mineral building materials is illustrated by the DF imaging of a Ketton limestone. Additionally, the capability of the DP-XGI to differentiate features in the nanoscale range is proven with the dark-field of Silica nanoparticles at different correlation lengths of calibrated sizes of 106 nm, 261 nm, and 507 nm.

Energy Resolving Dark-Field Imaging with Dual Phase Grating Interferometer.

Energy-resolving large area X-ray imaging enabled by stacked metal halide scintillators

Implementation of a dual-phase grating interferometer for multi-scale characterization of building materials by tunable dark-field imaging

Dual phase grating interferometer for tunable dark-field sensitivity

X-ray Dark-Field Imaging with a Single Absorption Grating

Modeling of beam hardening effects in a dual-phase X-ray grating interferometer for quantitative dark-field imaging

Analysis of Period and Visibility of Dual Phase Grating Interferometer

Single-exposure X-ray dark-field imaging via a dual-energy propagation-based setup

Investigation of the Partially Coherent Effects in a 2D Talbot Interferometer

Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures

X-ray dark-field via spectral propagation-based imaging

Transmission, Refraction and Dark-Field Retrieval in Hard X-ray Grating Interferometry.

X-ray phase-sensitive microscope imaging with a grating interferometer: theory and simulation

Single-shot grating-based x-ray differential phase contrast imaging with a modified analyzer grating

Quantitative Coherence Analysis of Dual Phase Grating X-Ray Interferometry with Source Grating*

Cramér-Rao lower bound of dark-field imaging using a grating interferometer

X-ray Interferometry Using a Modulated Phase Grating: Theory and Experiments

Preliminary Demonstration of Flexible Dual-Energy X-Ray Phase-Contrast Imaging

Quantitative grating-based x-ray dark-field computed tomography

Theoretical and experimental analysis of the modulated phase grating X-ray interferometer

Single-shot X-Ray Phase Imaging with Grating Interferometry and Photon-Counting Detectors.