Photoionisation Detection of a Single Er3 + Ion with Sub-100-ns Time Resolution

Yangbo Zhang,Wenda Fan,Jiliang Yang,Hao Guan,Qi Zhang,Xi Qin,Changkui Duan,Gabriele G. de Boo,Brett C. Johnson,Jeffrey C. McCallum,Matthew J. Sellars,Sven Rogge,Chunming Yin,Jiangfeng Du
DOI: https://doi.org/10.1093/nsr/nwad134
IF: 20.6
2024-01-01
National Science Review
Abstract:Efficient detection of single optical centres in solids is essential for quantum information processing, sensing and single-photon generation applications. In this work, we use radio-frequency (RF) reflectometry to electrically detect the photoionisation induced by a single Er3+ ion in Si. The high bandwidth and sensitivity of the RF reflectometry provide sub-100-ns time resolution for the photoionisation detection. With this technique, the optically excited state lifetime of a single Er3+ ion in a Si nano-transistor is measured for the first time to be 0.49 +/- 0.04 mu s. Our results demonstrate an efficient approach for detecting a charge state change induced by Er excitation and relaxation. This approach could be used for fast readout of other single optical centres in solids and is attractive for large-scale integrated optical quantum systems thanks to the multi-channel RF reflectometry demonstrated with frequency multiplexing techniques.
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