Abstract:In modern microprocessor and SoC designs, supply noise margin has been significantly reduced due to the continuously decreasing supply voltage level. On the other hand, with increasing current density, chips may see larger supply noise variations on various spots and from time to time. As a result, chip robustness and reliability are inevitably deteriorated with more frequent supply noise emergencies. It is therefore crucial to have an efficient supply noise prediction method to enhance design robustness. The state-of-art solutions either try to build a spatial noise estimation framework at the layout-level using the limited distributed physical noise sensors or attempt to develop emergency predictors at the architecture-level thus ignore back-end power delivery details In this paper, we propose a cross-layer framework for temporal supply noise prediction. Our method not only accounts for the temporal characteristics of workload execution at micro-architecture-level but also incorporates the power delivery model at the circuit-level into such system-level prediction. In order to enable the capability of on-the-fly noise prediction, we first bridge the gap between system-level workload and micro-architectural-level power by employing an OLS-based power estimation model and an adaptive ARIMA-based power prediction model. Then a layout-level supply noise model is developed to explore the correlations between micro-architectural-level power and layout-level supply noise. Compared with existing methods, the proposed ARIMA-based power model improves the prediction performance by up to 37.5%/63.0% in X86/ARM. Moreover, compared with SPICE simulation, our framework is able to estimate present supply noise with an average error of 0.005% and predict future supply noise with an average error of 1.58%/1.17% for X86/ARM architecture.

Invited Paper: Unleashing the Potential of Machine Learning: Harnessing the Dynamics of Supply Noise for Timing Sign-Off

Dynamic Supply Noise Aware Timing Analysis with JIT Machine Learning Integration

Fast Machine-Learning-Driven Supply Noise-Aware Macromodeling for High-Speed Nonlinear Drivers

A Cross-Layer Framework for Temporal Power and Supply Noise Prediction

A Silicon-Validated Methodology for Power Delivery Modeling and Simulation

Accelerating Chip Design with Machine Learning: from Pre-Silicon to Post-Silicon

Worst-Case Dynamic Power Distribution Network Noise Prediction Using Convolutional Neural Network

Impact of Supply Noise on Nano-Meter VLSI Design: Hard or Soft Threshold?

Silicon-Validated Power Delivery Modeling and Analysis on a 32-Nm DDR I/O Interface.

Noise-aware DVFS Transition Sequence Optimization for Battery-Powered IoT Devices.

A Multicore Chip Load Model for PDN Analysis Considering Voltage–Current-Timing Interdependency and Operation Mode Transitions

A Cross-Layer Framework for Early-Stage Full Chip Oxide Breakdown Reliability Analysis

A Survey on Machine Learning-Based Technology for Static Timing Analysis in Agile Design

Agile Full-Chip Sign-Off in the Post-Moore Era

Machine Learning in Nanometer AMS Design-for-Reliability : (invited Paper)

Concurrent Sign-off Timing Optimization Via Deep Steiner Points Refinement.

New Noise-Tolerant Dynamic Circuit Design

Slot: A Supervised Learning Model to Predict Dynamic Timing Errors of Functional Units

When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited)

Machine-learning-coined noise induces energy-saving synchrony

MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper