Abstract:The stagnation of EDA technologies roots from insufficient knowledge reuse. In practice, very similar simulation or optimization results may need to be repeatedly constructed from scratch. This motivates my research on introducing more 'intelligence' to EDA with machine learning (ML), which explores complex correlations in design flows based on prior data. Besides design time, I also propose ML solutions to boost IC performance by assisting the circuit management at runtime. In this dissertation, I present multiple fast yet accurate ML models covering a wide range of chip design stages from the register-transfer level (RTL) to sign-off, solving primary chip-design problems about power, timing, interconnect, IR drop, routability, and design flow tuning. Targeting the RTL stage, I present APOLLO, a fully automated power modeling framework. It constructs an accurate per-cycle power model by extracting the most power-correlated signals. The model can be further implemented on chip for runtime power management with unprecedented low hardware costs. Targeting gate-level netlist, I present Net2 for early estimations on post-placement wirelength. It further enables more accurate timing analysis without actual physical design information. Targeting circuit layout, I present RouteNet for early routability prediction. As the first deep learning-based routability estimator, some feature-extraction and model-design principles proposed in it are widely adopted by later works. I also present PowerNet for fast IR drop estimation. It captures spatial and temporal information about power distribution with a customized CNN architecture. Last, besides targeting a single design step, I present FIST to efficiently tune design flow parameters during both logic synthesis and physical design.

Machine Learning in Nanometer AMS Design-for-Reliability : (invited Paper)

Accelerating Chip Design with Machine Learning: from Pre-Silicon to Post-Silicon

Invited Paper: Unleashing the Potential of Machine Learning: Harnessing the Dynamics of Supply Noise for Timing Sign-Off

Machine Learning for Electronic Design Automation: A Survey

Review: Machine learning techniques in analog/RF integrated circuit design, synthesis, layout, and test

MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper

Analog/Mixed-Signal Circuit Synthesis Enabled by the Advancements of Circuit Architectures and Machine Learning Algorithms

An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs

Special Session: Machine Learning for Embedded System Design

A Machine Learning Based Reliability Analysis of Negative Bias Temperature Instability (NBTI) Compliant Design for Ultra Large Scale Digital Integrated Circuit

Machine learning and pattern matching in physical design

Survey of Machine Learning for Software-assisted Hardware Design Verification: Past, Present, and Prospect

Machine Learning-Assisted Device Modeling With Process Variations for Advanced Technology

Improving Semiconductor Device Modeling for Electronic Design Automation by Machine Learning Techniques

Machine Learning-Based Device Modeling and Performance Optimization for FinFETs

A Review of Machine Learning Techniques in Analog Integrated Circuit Design Automation

Intelligent Circuit Design and Implementation with Machine Learning

Variability- and Reliability-Aware Design for 16/14nm and Beyond Technology

Integration of AI and Machine Learning in Semiconductor Manufacturing for Defect Detection and Yield Improvement

Machine Learning for Reliability Engineering and Safety Applications: Review of Current Status and Future Opportunities

An Adaptive Machine Learning Method Based on Finite Element Analysis for Ultra Low-k Chip Package Design