Research on Lifetime Evaluation of IGBT Module in Wave Energy Converter Considering Environmental Uncertainty

Dongqiang Jia,Jing Wang,Xiong Du

DOI: https://doi.org/10.1109/ACEEE58657.2023.10239666

2023-01-01

Abstract:Insulated gate bipolar transistors (IGBTs) are one of the weak links of the wave energy converter. Accurate lifetime evaluation is an important support for the reliable operation of the wave energy conversion system. However, the impact of operating environment uncertainty wasn’t consider in the current IGBT module lifetime evaluation model. This paper proposes a lifetime evaluation model of IGBT module considering environmental uncertainty, which effectively simulates the uncertainty of environmental temperature and wave energy power generation and improves the accuracy of lifetime evaluation results. Firstly, the Monte Carlo method is used to generate a large number of random scenarios to simulate the uncertainty of operating environment, and the scenario reduction method is introduced to extract typical operating scenarios. The scenario generation scenario and reduction fully balance the contradiction between accuracy and computational complexity of lifetime evaluation model. Secondly, the mission profile is divided into different time scales, and the influence of low frequency junction temperature and high frequency junction temperature on the life loss of IGBT module is quantitatively analyzed. Finally, the effects of different lifetime evaluation methods are compared by simulation, and the simulation results show that the proposed lifetime evaluation model has higher accuracy.