≪title>grating Diffraction for Strain Measurement in a Microscope</title>

Bing Zhao,Anand Asundi
DOI: https://doi.org/10.1117/12.323364
1998-01-01
Abstract:In this paper, a compact microscope system for direct strain measurement is presented. It involves the grating diffraction method coupled with microscopy and image processing technique. A Leitz optical transmitting microscope with white light source is reconstructed by developing a loading and recording system. Gratings with median density from 40 - 200 l/mm are used. With the help of a Bertrand lens, the Fourier spectrum of the grating, not the grating image is formed on the CCD sensor plane with high image quality. A software which can precisely, quickly and automatically determine the diffraction spot centroids is developed. The local strain is measured with high spatial resolution. A discussion on improving the sensitivity in multiple ways is suggested.
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