AReferenced Geometry BasedConfiguration Scalable MextramModelforBipolar Transistors

Hui-Chun Wu,Slobodan Mijalković
2006-01-01
Abstract:A behavioral reference basedmodelfor configuration scaling of bipolar transistor model parameters isproposed. Themodelisapplicable to bipolar technologies withoneortwocollector contacts anddifferent numberofemitters. Theeffectiveness of theproposed scaling methodology isverified incase studiesusingadvancedhigh-speed SiGe HBT technology. IndexTerms - Geometry scaling, Multi-emitter SiGe HBT, Mextrammodel,thermalresistance, collector resistance.
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