Microstructural Characterization of Sintered MoSi<sub>2</sub>/SiC<sub>P</sub> Composites

Jie Li,G. Y. Yang,Jing Zhu,L. Q. Zhang,W. Y. Yang,Z. Q. Sun
DOI: https://doi.org/10.1111/j.1151-2916.2000.tb01315.x
IF: 4.186
2000-01-01
Journal of the American Ceramic Society
Abstract:A MoSi2/SiCP composite was synthesized by in situ reactive sintering of a mixture of molybdenum, silicon, and carbon powders. Its microstructural features were studied by X‐ray energy dispersive spectroscopy (EDS), conventional transmission electron microscopy (CTEM), and high‐resolution transmission electron microscopy (HREM). It was determined that the composite was composed of α‐MoSi2 and β‐SiC. There were no specific orientation relationships between the MoSi2 matrix and SiCP, because the MoSi2 and SiC were formed at 1450°C by the reaction of solid Mo and C and liquid Si. The abrupt change occurring in the microstructure of the composite is explained by the presence of an interface between MoSi2 and SiCP, where no observable SiO2 amorphous layer or particles were found. Microtwins and stacking faults were frequently observed in {111} planes of SiCP.
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