Abstract:Modern CMOS imaging devices are present everywhere, in the form of line, area and depth scanners. These image devices can be used in the automotive field, in industrial applications, in the consumer’s market, and in various medical and scientific areas. Particularly in industrial and scientific applications, the low-light noise performance or the high dynamic-range features are often the cases of interest, combined with low power dissipation and high frame rates. In this sense, the noise floor performance and the power consumption are the focus of this work, given that both are interlinked and play a direct role in the remaining sensor features. It is known that thermal and flicker noise sources are the main contributors to the degradation of the sensor performance, concerning the sensor output image noise. This paper presents an indirect way to reduce both the thermal and the flicker noise contributions by using thin-oxide low voltage supply column readout circuits and fast 3rd order incremental sigma-delta converters with noise shaping capabilities (to provide low noise output digital samples—74 μVrms; 0.7 e−rms; at 105 μV/e−), and thus performing correlated double sampling in a short time (19 μs), while dissipating significant low power (346 μW). Throughout the extensive parametric transistor-level simulations, the readout path produced 1.2% non-linearity, with a competitive saturation capacity (6.5 ke−) pixel. In addition, this paper addresses the readout parallelism as the main point of interest, decoupling resolution from the image noise and the frame rate, at virtually any array resolution. The design and simulations were performed with Virtuoso 6.17 tools (Cadence Design Systems, San Jose, CA, USA) using Spectre models from TS18IS Image Sensor 0.18 μm Process Development Kit (Tower Jazz Semiconductor, Migdal Haemek, Israel).

A Global Shutter Frame Difference Sensor with Offset Suppression Technique

Efficient Frame Rate Control Algorithm and Its Implementation

14-Bit Column Readout Circuits with Single-to-differential PGA Using Intentional Offset and Two-Step Scaled-Reference SAR ADC for CMOS Image Sensors

FD-SOI-Based Pixel with Real-Time Frame Difference for Motion Extraction and Image Preprocessing

Global shutter CMOS vision sensors and event cameras for on‐chip dynamic information

A Low Noise 384×288 Uncooled Infrared Imager Based on Phase Difference Modulation

A 216 × 216 Global-Shutter CMOS Image Sensor With Embedded Analog Memory and Automatic Exposure Control for Under-Display Optical Fingerprint Sensing Applications

A Low-Noise CMOS Image Sensor With Digital Correlated Multiple Sampling

A Novel Low Dark Current 9T Global Shutter Pixel with Merged Active Area

A Dual-Mode CMOS Image Sensor Based on In-Pixel Frame Differencing

In‐panel ambient light eliminating differential circuit applied to active pixel fingerprint sensor

An Improved Low Power Cmos Readout Circuit For Focal Plane Array

Novel Logarithmic Active Pixel Sensor with High Dynamic Range and High Output Swing

320×240 Pixels CMOS Digital Image Sensor with Wide Dynamic Range

Low-light-level CMOS imaging sensor with CTIA and digital correlated double sampling

A 1/2.5 Inch Vga 400 Fps Cmos Image Sensor with High Sensitivity for Machine Vision

A dual threshold adaptation method to dynamic vision sensor pixel

An improved pixel circuit with low noise event rate and enhanced bright‐light sensitivity for dynamic vision sensor

A Time-to-Digital Converter for Low-Power Consumption Single Slope Analog-to-Digital Converters in a High-Speed CMOS Image Sensor

Design Improvements on Fast, High-Order, Incremental Sigma-Delta ADCs for Low-Noise Stacked CMOS Image Sensors

Noise Improvement and High Dynamic Range in a CMOS Image Sensor With Shift Biasing Structure