Abstract:This paper presents an innovative readout scheme that utilizes a pair of differential‐clocks‐assisted time‐to‐digital converter (DCA‐TDC) in CISs. The DCA‐TDC utilizes only half the number of ordinary TDC delay chain units by employing a binary‐weighted search algorithm to determine the MSB for fine quantization of a SS ADC. Additionally, the layout area and dynamic power introduced by the improved DCA‐TDC delay chain are halved compared to an ordinary TDC delay chain. This paper presents an innovative readout scheme that utilizes a pair of differential‐clocks‐assisted time‐to‐digital converter (DCA‐TDC) in CMOS image sensors (CISs). The DCA‐TDC utilizes only half the number of ordinary TDC delay chain units by employing a binary‐weighted search algorithm to determine the most significant bit (MSB) for fine quantization of a single‐slope analog‐to‐digital converter (SS ADC). Additionally, the layout area and dynamic power introduced by the improved DCA‐TDC delay chain are halved compared to an ordinary TDC delay chain. The proposed SS ADC is designed and simulated using the 0.11 μ m standard CMOS proces, achieving an 11‐bit ADC with a column‐level power consumption of 65.4 μ W, and a row conversion time of 2.72 μ s, within a design environment featuring an analog voltage of 3.3 V, a digital voltage of 1.5 V, a clock frequency of 62.5 MHz, and a temporal resolution of 500 ps. Furthermore, this design achieves an effective number of bits (ENOB) of 10.71 and a figure of merit (FoM) of 110.5 fJ/step. By interpolating a DCA‐TDC, the quantization speed is enhanced compared to traditional SS ADCs, presenting an effective solution for high‐frame‐rate CIS implementations.

A 216 × 216 Global-Shutter CMOS Image Sensor With Embedded Analog Memory and Automatic Exposure Control for Under-Display Optical Fingerprint Sensing Applications

Multiplexed Chemical Sensing CMOS Imager.

A Reconfigurable Convolution-in-Pixel CMOS Image Sensor Architecture

14-Bit Column Readout Circuits with Single-to-differential PGA Using Intentional Offset and Two-Step Scaled-Reference SAR ADC for CMOS Image Sensors

A 14-bit 150KS/s SAR ADC with PGA for CMOS Image Sensor

A 1/2.5 Inch Vga 400 Fps Cmos Image Sensor with High Sensitivity for Machine Vision

High Performance CMOS Image Sensor for Low Light Imaging

A Three-Wafer-Stacked Hybrid 15-MPixel CIS + 1-MPixel EVS With 4.6-GEvent/s Readout, In-Pixel TDC, and On-Chip ISP and ESP Function

A 70-dB SNR High-Speed Global Shutter CMOS Image Sensor for in Situ Fluid Concentration Distribution Measurements

A 64Mpixel CMOS Image Sensor with $0.50 \mu\mathrm{m}$ Unit Pixels Separated by Front Deep-Trench Isolation

Design Of A High Flexible Block-Based Computational Cmos Image Sensor

A 5.9μw Ultra-Low-Power Dual-Resolution CIS Chip of Sensing-with-Computing for Always-on Intelligent Visual Devices

320×240 Pixels CMOS Digital Image Sensor with Wide Dynamic Range

A 2.17μw@120fps Ultra-Low-Power Dual-Mode CMOS Image Sensor with Senputing Architecture

A 2.72 μ s row conversion time 11‐bit column‐parallel single‐slope analog to digital converter with differential‐clocks‐assisted time to digital converter interpolation for complementary metal oxide semiconductors image sensor

CMOS Image Sensor Data-Readout Method for Convolutional Operations with Processing Near Sensor Architecture.

P‐15.1: Large Area and Low Cost Fingerprint on Display Technology

Low-light-level CMOS imaging sensor with CTIA and digital correlated double sampling

A Monolithically Integrated 640 × 512 CMOS-Perovskite Image Sensor

A 51-Pj/pixel 33.7-Db PSNR 4× Compressive CMOS Image Sensor with Column-Parallel Single-Shot Compressive Sensing

Development of 3-layer stacked global shutter CMOS image sensor with pixel pitch Cu-to-Cu interconnection and high-capacity capacitors