Strain Field Measurement from 1600 °C to 3200 °C by Adaptive-Exposure Ultraviolet Digital Image Correlation under Exponential Variation of Self-Illumination Intensity

Zhiwei Pan,Shenghong Huang,Menglai Jiang,Bowen Zhao,Kai Zhao,Yong Su

DOI: https://doi.org/10.2139/ssrn.4216566

2022-01-01

SSRN Electronic Journal

Abstract:In practical engineering applications, strain field measurements of materials and structures with digital image correlation (DIC) under ultrahigh temperatures are of great significance for understanding their mechanical behaviors and performance in extreme servicing environments. However, strong self-illumination interference by the tested target makes the task very challenging, especially when the temperature of the test target varies over a large span, and the self-illumination intensity will change exponentially. In this work, we propose an adaptive exposure controlled ultraviolet digital image correlation (UV-DIC) technique illuminated by the light source of the target self-radiation. The strain field measurement of a heated tungsten target is realized via the proposed technique from 1600 °C to 3200 °C. Compared with the existing blue light illuminated DIC using a fixed exposure control logic, the proposed UV-DIC system can adaptively suppress the exponential illumination intensity by an adaptive-exposure control algorithm according to the captured image grayscale at different heated temperature stages. The adjustment of the exposure time can be quickly accomplished by electronic signals to maintain the imaging speed of the UV-DIC camera. It is concluded that the proposed UV-DIC system is able to obtain high contrast and moderate brightness images under the condition that the intensity of the self-radiation light source changes exponentially, ensuring good DIC quality. The peak deviation of the measured strain in 3000 °C range is reduced from 7% to 1%, providing a more accurate and effective solution for the practical engineering applications of DIC at ultrahigh temperatures.