Abstract:The memristor crossbar provides a unique opportunity to develop a neuromorphic computing system (NCS) with high scalability and energy efficiency. However, the reliability issues that arise from the immature fabrication process and physical device limitations, i.e., variations and stuck-at-faults (SAF), dramatically prevent its wide application in practice. Specifically, variations make the programmed weights deviate from their expected values. On the other hand, defective mem-ristors cannot even represent the weights effectively. In this work, we propose a variation- and defect-aware framework to improve the reliability of memristor-based NCS while minimizing the inference performance loss. We propose to develop analytical weight models to characterize the non-ideal effects of variations and SAFs, which can then be incorporated into a Bayesian neural network as priori and constraint. We then convert the reliability improvement to the neural network training for optimal weights that can accommodate variations and defects across the chips, which does not require computation-intensive retraining or cost-expensive testing. Extensive experimental results with the proposed framework confirm its effective capability of improving the reliability of NCS, while significantly mitigating the inference accuracy degradation under even severe variations and SAFs.

Thermal Induced Retention Degradation of RRAM-based Neuromorphic Computing Chips

Robustness of Neuromorphic Computing with RRAM-based Crossbars and Optical Neural Networks.

Aging Aware Retraining for Memristor-based Neuromorphic Computing

Reliable Memristor-based Neuromorphic Design Using Variation- and Defect-Aware Training

Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems

Investigation of Statistical Retention of Filamentary Analog RRAM for Neuromophic Computing

Statistical Temperature Coefficient Distribution in Analog RRAM Array: Impact on Neuromorphic System and Mitigation Method

A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems

Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems.

Temperature-Dependent Accuracy Analysis and Resistance Temperature Correction in RRAM-Based In-Memory Computing

Multi-Scale Thermal Modeling of RRAM-based 3D Monolithic-Integrated Computing-in-Memory Chips

Technology-Array-Algorithm Co-Optimization of RRAM for Storage and Neuromorphic Computing: Device Non-idealities and Thermal Cross-talk

Device and circuit optimization of RRAM for neuromorphic computing

Characterizing Endurance Degradation of Incremental Switching in Analog RRAM for Neuromorphic Systems

Impact of Programming Process on Temperature Coefficient in Analog RRAM.

An RRAM Retention Prediction Framework Using a Convolutional Neural Network Based on Relaxation Behavior

Self-Terminating Write of Multi-Level Cell ReRAM for Efficient Neuromorphic Computing

Reliability Perspective on Neuromorphic Computing Based on Analog RRAM

The Impact of Endurance Degradation in Analog RRAM for In-Situ Training

Impact and Quantization of Short-Term Relaxation Effect in Analog RRAM

Crossbar-Level Retention Characterization in Analog RRAM Array-Based Computation-in-Memory System