Reliability Perspective on Neuromorphic Computing Based on Analog RRAM

Huaqiang Wu,Meiran Zhao,Yuyi Liu,Peng Yao,Yue Xi,Xinyi Li,Wei Wu,Qingtian Zhang,Jianshi Tang,Bin Gao,He Qian
DOI: https://doi.org/10.1109/irps.2019.8720609
2019-01-01
Abstract:A perspective is provided to compare the reliability requirements of Resistive Random Access Memory (RRAM) for digital memory application and neuromorphic computing application. Retention and endurance are considered as the two key metrics to evaluate the impact on neural network training. Statistical measurements and network simulation demonstrate that the retention and endurance degradation behaviors of analog RRAM are quite unique when implementing on a neuromorphic computing system. New evaluation method is therefore needed for reliability test.
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