Low Secondary Electron Yield Materials for Space Applications Based on Ab Initio Computation
Min Peng,Yongdong Li,Chunliang Liu,Dawei Wang
DOI: https://doi.org/10.1109/ivec.2019.8745221
2019-01-01
Abstract:Anti-multipactor in space microwave devices is of great significance in a vacuum environment. It contributes to overcome one important limiting factor, i.e, the high secondary electron emission (SEE), which threatens the safety of various microwave devices in spacecrafts. In this paper, based on existing models of SEE, the relationship between the secondary electron yield (SEY) and work function is discussed for metallic materials with different crystal planes. Furthermore, we have computed the work function for solid material surfaces and electron affinity for dielectrics using simulations, trying to establish a correlation between chemical constituents, atomic geometry and surface potential barrier of materials and to understand the influence of lattice structure and atomic arrangement on SEY. We have accurately computed the work functions of a few materials, including: (1) Work functions of metals and their oxides (with oxides showing higher maximum SEY); (2) Work functions for MgO and NiO single crystals, as well as superlattices made from them; (3) Work functions for metals (Cu, Ni) and graphene covered metals (Cu, Ni). Moreover, a method to avoid the sensitive area and reducing the SEY is proposed in the structure design, which is expected to come into experimental verification. At last, we focus on the scattering cross section underpinning most essential physical process of the secondary electron emission problem, and try to get a response from Monte Carlo simulation using the factors calculated above and the multi generation model on rough surfaces.