Tantalum Microwave Resonators with Ultra-High Intrinsic Quality Factors

Lili Shi,Tingting Guo,Runfeng Su,Tianyuan Chi,Yifan Sheng,Junliang Jiang,Chunhai Cao,Jingbo Wu,Xuecou Tu,Guozhu Sun,Jian Chen,Peiheng Wu
DOI: https://doi.org/10.1063/5.0124821
IF: 4
2022-01-01
Applied Physics Letters
Abstract:We acquire tantalum thin film in its α phase (α-Ta) using direct-current magnetron sputtering. According to x-ray diffraction results, 110-Ta is dominant. Quarter-wavelength coplanar waveguide resonators are fabricated with the α-Ta film and characterized at millikelvin in a dilution refrigerator. In the single photon regime, an intrinsic quality factor (Qi) up to 3×106 is obtained in these resonators. At high power, Qi rises to 6×106. Moreover, we also fabricate an array with 7 × 7 lumped element resonators using the α-Ta film. The array shows excellent uniformity. At high power, Qis of all pixels exceed 1×106. In the single photon regime, Qis of over 90% pixels exceed 1×106. Superconducting quantum computing and ultrasensitive electromagnetic wave detectors will benefit a lot from devices based on the α-Ta film.
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