Wafer‐Scale Oxygen‐Doped MoS 2 Monolayer

Zheng Wei,Jian Tang,Xuanyi Li,Zhen Chi,Yu Wang,Qinqin Wang,Bo Han,Na Li,Biying Huang,Jiawei Li,Hua Yu,Jiahao Yuan,Hailong Chen,Jiatao Sun,Lan Chen,Kehui Wu,Peng Gao,Congli He,Wei Yang,Dongxia Shi,Rong Yang,Guangyu Zhang
DOI: https://doi.org/10.1002/smtd.202100091
IF: 12.4
2021-04-10
Small Methods
Abstract:<p>Monolayer MoS<sub>2</sub> is an emergent 2D semiconductor for next‐generation miniaturized and flexible electronics. Although the high‐quality monolayer MoS<sub>2</sub> is already available at wafer scale, doping of it uniformly remains an unsolved problem. Such doping is of great importance in view of not only tailoring its properties but also facilitating many potential large‐scale applications. In this work, the uniform oxygen doping of 2 in wafer‐scale monolayer MoS<sub>2</sub> (MoS<sub>2−</sub><i><sub>x</sub></i>O<i><sub>x</sub></i>) with tunable doping levels is realized through an in situ chemical vapor deposition process. Interestingly, ultrafast infrared spectroscopy measurements and first‐principles calculations reveal a reduction of bandgaps of monolayer MoS<sub>2−</sub><i><sub>x</sub></i>O<i><sub>x</sub></i> with increased oxygen‐doping levels. Field‐effect transistors and logic devices are also fabricated based on these wafer‐scale MoS<sub>2−</sub><i><sub>x</sub></i>O<i><sub>x</sub></i> monolayers, and excellent electronic performances are achieved, exhibiting promise of such doped MoS<sub>2</sub> monolayers.</p>
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
What problem does this paper attempt to address?
This paper aims to solve the problem of uniform oxygen doping in single - layer molybdenum disulfide (MoS\(_2\)) on the wafer scale. Although high - quality single - layer MoS\(_2\) can already be obtained on the wafer scale, its uniform doping remains an unsolved problem. Doping is crucial not only for adjusting the properties of materials but also for promoting many potential large - scale applications. In this study, uniform oxygen doping (MoS\(_{2 - x}\)O\(_x\)) of single - layer MoS\(_2\) on the wafer scale was achieved through an in - situ chemical vapor deposition process, and the doping level can be adjusted by controlling the oxygen flow rate during the growth process. It was found that as the oxygen doping level increases, the band gap of single - layer MoS\(_{2 - x}\)O\(_x\) decreases and a transition from a direct band to an indirect band occurs. In addition, field - effect transistors (FETs) and logic devices fabricated based on these wafer - scale MoS\(_{2 - x}\)O\(_x\) single layers exhibit excellent electronic properties, indicating the great potential of such doped MoS\(_2\) single layers in high - performance electronics and optoelectronics.