Abstract:The power loss of modern type-III ZnO varistor ceramics could steadily decrease in the long-term dc aging, which is just the opposite of continuously increasing power loss of traditional ones. It is beyond current understandings on dc aging based on the classic ion migration model, leaving the condition assessment and life prediction lacking of physical fundamental. Progress on the long-term dc aging of these ZnO varistor ceramics is thus systematically reviewed in this paper. The most distinctive aging phenomena of them are found to be the reversibility in aging and the “crossover” in current density-electric field characteristics. The former indicates the stability of interface states, while the latter emphasizes important roles of dynamic carrier transport across double Schottky barriers. Moreover, the unique reversibility of type-III ZnO varistor ceramics makes it possible to distinguish the controversial major mobile ions as Zni. Based on the above findings, a quantitative Donor Ion Redistribution (DIR) model is proposed, which ascribes aging of ZnO varistor ceramics to the competition between donor redistribution and consumption of interface states. The former is dominative in type III via forming “U-shape” donor distributions with stable interface states, contributing to “crossover” and reversibility. While the latter overlaps the former in type-I and II samples, leading to increase in power loss. Aging of type III is simulated based on DIR model. Excellent agreement between simulation results and experimental results is found, confirming the validity of DIR model. Moreover, power loss is found not an intrinsic parameter to assess the long-term stability according to DIR model. On the contrary, the reverse aging coefficient $K_{r}$ is found to be a potential parameter for condition assessments. This paper helps for in-depth understandings on aging of ZnO varistor ceramics and opening new avenues to assess long-term stability.

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