Abstract:The field of local conductivity measurement has produced many kinds of scanning probes to measure the electricalcharacteristics at the nanoscale. However, due to the design limitations, no appropriate probe has been developed to measureand simultaneously image the electrical characteristics at 100 nm order. This research aims to fabricate a four-pOint AFMprobe in order to image electrical characteristics at 100 nm ord Four-point atomic force microscope probe for imaging the electrical characteristics of materials Lin ZHANG", Yang JU*2 and Atsushi HOSOI*2 *1Nagoya Univ. Dept. of Mechanical science and Engineering Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan The field of local conductivity measurement has produced many kinds of scanning probes to measure the electrical characteristics at the nanoscale. However, due to the design limitations, no appropriate probe has been developed to measure and simultaneously image the electrical characteristics at 100 nm order. This research aims to fabricate a four-point AFM probe in order to image electrical characteristics at 100 nm order. Specifically, a certain tape of AFM probe for cell measurement e.g . Biolever, can be etched into four independent electrodes with an in-between space of 200 nm. The four electrodes are basically used to measure the electrical potential drop by allowing the electric current to pass through. The four-point probe is then integrated into a multimode AFM to realize the scanning and imaging simultaneously. The present experimental results show that the four-point probe fabricated can be used to image the surface topography of the Au nanowire, thereby permitting the simultaneous measurements of surface profiles and electrical characteristics of the samples at the next stage.

A super high aspect ratio atomic force microscopy probe for accurate topography and surface tension measurement

Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging.

Large Range Atomic Force Microscopy with High Aspect Ratio Micropipette Probe for Deep Trench Imaging

Efficient Fabrication of a High-Aspect-ratio AFM Tip by One-Step Exposure of a Long Focal Depth Holographic Femtosecond Axilens Beam

Surface Profile Measurement of Micro-Optics by Using a Long Stroke Atomic Force Microscope

High Quality-Factor Quartz Tuning Fork Glass Probe Used In Tapping Mode Atomic Force Microscopy For Surface Profile Measurement

Electrochemical Preparation of STM Probes for High Aspect Ratio Nanometrology

Atomic Force Microscope in Liquid with A Specially Designed Probe for Practical Application

On-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging

A novel scanning tunneling microscopy for long range and high aspect ratio measurement

Optimization Of The Tip Of Microwave Afm Probe

Profile Measurements of Micro-Aspheric Surfaces Using an Air-Bearing Stylus with A Microprobe

A Large-Sample Atomic Force Microscope Observing in Both Air and Liquid

Three-dimensional atomic force microscopy based on tailored cantilever probe with flared tip

NOVEL AFM PROBE FOR LOCAL CONDUCTIVITY MEASUREMENT

The Art of Electrochemical Etching for Preparing Tungsten Probes with Controllable Tip Profile and Characteristic Parameters

Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe

Development of a New Microscopic Four-Point AFM Probe for the Measurement of Local Electrical Conductivity

Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy

G030083 Four-point Atomic Force Microscope Probe for Imaging the Electrica1 Characteristics of Materials

A Horizontal Atomic Force Microscope and Its Applications