Decomposition Products and Mechanism of C5F10O/N2 Gas Mixture by Electron Attachment Mass Spectrometry

Xiaonan Wang,Huan Yuan,Aijun Yang,Dingxin Liu,Xiaohua Wang,Mingzhe Rong
DOI: https://doi.org/10.1109/tdei.2022.3173491
IF: 2.509
2022-01-01
IEEE Transactions on Dielectrics and Electrical Insulation
Abstract:This work aims to detect the discharge products and study the decomposition characteristics of C 5 F 10 O/N 2 gas mixture under pulsed discharge. Discharge tests are carried out on three kinds of gas mixtures with different contents of C 5 F 10 O (3.3%, 10%, and 30%). Electron attachment mass spectrometry (MS) is proposed to detect discharge products after negative ionization, and the results are compared with that in gas chromatography (GC) MS. The discharge products are detected and the formation pathways of the main decomposition products are deduced. The results show that the densities of some products increase with the number of discharge pulses. There are differences on the types of products and the cumulative effect of discharge in the three kinds of gas mixtures. Furthermore, these discharge products are able to characterize the discharge accumulation effects in power switchgear, such as insulation degradation.
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