Experimental Study on the Spatial Performance of Photorefractive X-ray Semiconductor Ultrafast Response Chip

Tan Xiaobo,Yan Xin,Yi Tao,He Kai,Shao Zhengzheng,Zhou Kaikai,Gao Guilong,Wang Tao,Zhang Jun,Zhuang Zhaowen
DOI: https://doi.org/10.3788/gzxb20225102.0251215
IF: 0.6
2022-01-01
ACTA PHOTONICA SINICA
Abstract:The traditional ultrafast electric vacuum devices are usually based on the mechanism of photoelectric conversion, and their performance is restricted by factors such as material response and space-charge effect. It is difficult for the devices like microchannel plate framing cameras, Dilation X-ray Imager (DIXI) , streak cameras to achieve high temporal resolution (100 fs similar to 1 ps) and spatial resolution (similar to mu m) two-dimensional imaging. Ultrafast imaging technology based on photorefractive effect is a new ultrafast diagnostic technology, which has the advantages of high spatiotemporal resolution, all-optical, all and anti radiation. The nonequilibrium carrier lifetime of low temperature grown AlGaAs (LT-AlGaAs) can reach ps-level. The Ultrafast Response Chip (URC) made of LT-AlGaAs has the characteristics of high temporal resolution, meanwhile, good spatial performance is the other key factor for its application. In this paper, the spatial performance of LT-AlGaAs URC is experimentally studied using X-ray, generated by high-energy nanosecond pulsed laser-produced plasma, as the signal. The results show that the URC has the ability of high spatial resolution and large-scale imaging in the X-ray energy dynamic range of 120: 1. The optimal spatial resolution is >= 35 1p/mm (R) MTF = 0.1, and the imaging frame can reach 6.7 mm x 6.7 mm. The results further verify the feasibility of ultrafast diagnostic technology based on photorefractive materials. In the future, LT-AIGaAs URC will be combined with ultrafast framing technologies such as dispersion framing and polarization chirp framing to realize multi-frames and high spatiotemporal resolution two-dimensional imaging.
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