Prototype design of wire scanner for shine*

Y. B. Leng,K. R. Ye,W. M. Zhou,L. Y. Yu,Jie. Chen,B. Gao,F. Z. Chen
2020-01-01
Abstract:SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of shine in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in shine, and some simulation results are also shown and discussed.
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