Abstract:The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its unprecedented ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are susceptible to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. In this work, we develop a method for easily demonstrating the presence of hysteretic (ie, false ferroelectric) long-range interactions between the sample and cantilever body. This method should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.

Wavelet Transform Based Method of Measuring Multi-Frequency Electrostatic Force Microscopy Dynamic Process

Improving Lateral Resolution of Electrostatic Force Microscopy by Multifrequency Method under Ambient Conditions

A Combined Wavelet-Fe Method for Transient Electromagnetic-Field Computations

Improving Lateral Resolution of Ambient Electrostatic Force Microscopy by Intermittent Contact Method

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Quantitative Electrostatic Force Measurement and Characterization Based on Oscillation Amplitude Using Atomic Force Microscopy

A Resolution Study for Electrostatic Force Microscopy on Bimetallic Samples Using the Boundary Element Method

Imaging of Electronical and Magnetic Properties on Sub-10 Nanometer Scale with Scanning Force Microscopy in Ambient

Development of Electrochemical High-Speed Atomic Force Microscopy for Visualizing Dynamic Processes of Battery Electrode Materials.

Numerical Studies on Sub-10 Nanometer Resolution Imaging in Electrostatic Force Microscopy

Time-frequency analysis of the tip motion in liquids using the wavelet transform in dynamic atomic force microscopy.

Detection of Embedded Nanostructures by Electrostatic Force Microscopy

Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope (AFM)

Quantitative Electromechanical Atomic Force Microscopy

An Electrochemical Impedance Spectroscopy Measurement Method Based on Multi-frequency Injection

Determination of Electrostatic Force and Its Characteristics Based on Phase Difference by Amplitude Modulation Atomic Force Microscopy.

A New Method to Measure Electroosmotic Flow Mobility of Capillary Electrophoresis by Abrupt Change of Current De‐noising Via Wavelet Transform

Single charge regime electrodynamic force measuring in solution by upconversion photonic force microscope

Numerical Simulation of the Interaction Between Nanodielectrics and the Probe of Electrostatic Force Microscopy

Measuring system for micro force based on electrostatic theory

High-resolution surface charge image achieved by a multiforce sensor based on a quartz tuning fork in electrostatic force microscope