In Situ Transient Laue X-Ray Diffraction During High Strain-Rate Tension.

Dongsheng Zhang,Can Yu,Ming Wang,Sen Chen,Chengpeng Huang,Darui Sun,Shuaipeng Yue,Ye Tao,Bingbing Zhang
DOI: https://doi.org/10.1063/5.0079582
2022-01-01
Abstract:In situ transient synchrotron Laue x-ray diffraction based on high-energy and broadband x rays under high strain-rate tensile loading was developed at a superconducting wiggler beamline at the Beijing Synchrotron Radiation Facility. A split-Hopkinson tensile bar is utilized to realize this dynamic loading condition, while the transient Laue x-ray diffraction captures the transient internal structure of monocrystalline materials. Plastic deformation of a monocrystalline nickel specimen was investigated to prove the ability of this instrumentation in the characterization of a dynamic response of monocrystalline materials during a high strain-rate impact process with 5 µs time resolution.
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