(Invited) Area-Selective Atomic Layer Deposition of Manganese Oxides on Metal−Dielectric Patterns

Yicheng Li,Kun Cao,Rong Chen
DOI: https://doi.org/10.1149/ma2020-02231660mtgabs
2020-01-01
Abstract:Area-selective atomic layer deposition (ALD) is a kind of high-precision deposition technologies where it happens only on designed areas. It is a very promising technology for scaling-down of nanodevices because of the characteristics of sub-nanoscale thickness control and bottom-up self-alignment. In this work, we report inherently selective ALD of MnOx on Pt/SiO2 substrates by adjusting the ALD processes parameters. Mn precursors with different ligands are introduced, namely Mn(thd)3 and Mn(EtCp)2. Through temperature and precursor pulse etc. regulation, an appropriate selective process windows are approached. During the first few ALD cycles, there is a nucleation delay on SiO2 surface, while it grows linearly on metal surface. The results of selectivity may come from the active oxygen on the platinum surface which promoted the reaction, while the dielectric surface has a nucleation delay. Through first-principles calculation, the reaction path and energy barrier are analyzed to explain the selective growth. The study broadens the family of selective deposition and provides guidance for specific applications, such as integrated circuits, optoelectronic devices, etc. Figure 1
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