Generalized Inversion Scheme for the Determination of Activation Energies from Flux-Creep Experiments in High-Tcsuperconductors

H. G. Schnack,R. Griessen,J. G. Lensink,Wen Hai-Hu
DOI: https://doi.org/10.1103/physrevb.48.13178
1993-01-01
Abstract:For thermally activated flux creep, which can be characterized by a temperature-magnetic-field-, and current-density-dependent activation energy [ital U]([ital j],[ital T];[ital B][sub [ital e]]), we show that this function can be determined from a combination of magnetization and magnetization dynamical relaxation rate data. As an illustration the method is applied to creep data on epitaxial YBa[sub 2]Cu[sub 3]O[sub 7] thin films. In contrast to previously proposed procedures, the present inversion scheme is much more general as it does not require [ital a] priori assumptions about the explicit temperature or field dependence of [ital U].
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