In Situ High-Temperature Transmission Electron Microscopy Investigation of Dynamic Element Migration for Sm-Co-Fe-Cu-Zr Sintered Magnets
Chao Wang,Peng Shen,Qiangfeng Li,Lei Wang,Meng Zheng,Hongsheng Chen,Lei Zhao,Yikun Fang,Jinbo Yang,Minggang Zhu,Haizhou Wang,Wei Li
DOI: https://doi.org/10.1016/j.matchar.2024.113936
IF: 4.537
2024-01-01
Materials Characterization
Abstract:The investigation delved into the dynamic migration of elements and the evolution of interface structures within the Sm(Co bal Fe 0.09 Cu 0.09 Zr 0.03 ) 7.2 magnet as temperature increased, employing high-temperature transmission electron microscopy. Notably, the Cu distribution exhibited temperature susceptibility. Elevating the temperature from room temperature (RT) to 400 degrees C led to a notable expansion in the distribution width of Cu, ranging from 28.5 to 50.8 nm. Simultaneously, the average Cu content at the cell boundaries decreased from 14.4 to 11.6 at.%. According to the high-temperature in-situ experimental results of the transmission electron microscopy thin-film samples, the derived diffusion coefficients, D 300 degrees C and D 400 degrees C , were determined as 0.0525 nm 2 /s and 1.414 nm 2 /s, respectively. The significantly higher D 400 degrees C compared to D 300 degrees C underscores the considerable influence of temperature on Cu element diffusion behavior. The simulation results demonstrate that the trend of magnetic properties variation at different temperatures closely aligns with the observed trend. Subsequent calculation of the temperature coefficient of intrinsic coercivity ( beta ) reveals that | beta 300 -400 degrees C | is notably higher than | beta RT-300 degrees C |. This suggests a substantial impact of Cu diffusion-induced deterioration on the beta . Moreover, micromagnetic simulation results delineated the reverse magnetization process for magnets at varying temperatures, revealing that the presence of the Cu diffusion region diminished the pinning effect of the cell boundary phase. Furthermore, a wider Cu diffusion region facilitated easier magnetic moment reversal at the cell boundary phase, resulting in a marked deterioration of intrinsic coercivity. This elucidates that the formation of the Cu diffusion region stands as one of the primary reasons for the sharp decline in magnetic properties of Sm 2 Co 17 -type magnets under high-temperature conditions.