Characteristic Mode Analysis Of Resistor-Loaded Frequency Selective Surfaces: Theoretical Research And Experimental Verification

Dace Zha,Jianxiong Dong,Kaixuan Si,Zhaowang Cao,Rui Li,Fan He,Ling Miao,Shaowei Bie,Jianjun Jiang
DOI: https://doi.org/10.1063/5.0056887
IF: 2.877
2021-01-01
Journal of Applied Physics
Abstract:In this paper, the modal behaviors and the frequency properties of resistor-loaded frequency selective surfaces have been systematically studied based on the periodic moment method and characteristic mode analysis. Through the observation of the phase curves of the reflection coefficients, we found that as the resistance value increases, the resonant frequency gradually moves toward higher frequencies. By calculating and analyzing the modal currents and the modal reflection coefficients of each mode, we know that the phenomenon is caused by higher-order modes. In order to reduce the influence of higher-order modes on the resonant frequency, a method of using more load resistors is proposed. To verify the proposed method, an absorber with high absorptivity is designed and measured. The measurement shows that the absorptivity of the designed absorber is more than -18 dB in the range of 1.92- 3.99 GHz. The experiment proves that the proposed loading method can be used to flexibly regularize the equivalent impedance of the lossy frequency selective surface without worrying about the negative effects of load resistors in the design of a circuit analog absorber.
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